Optical Inspection I/E
發(fā)布時(shí)間：2019-08-20 12:19:33
點(diǎn)擊數(shù)： 109
Optical Inspection I/E_BRUKER
Main Products: Surface Analyser (High Resolution Atomic Force Microscope, Probe Surface Profiler, Three-Dimensional Optical Microscope, etc.)
Applications: Widely used in semiconductor, display, medical and other laboratories/large-scale industrial production lines.
